I am an award winning highly quantitative Product Development Engineer who specializes in transforming raw silicon characterization data into predictable, high-yield products ready for mass production, with direct experience on cutting-edge 3nm and 2nm processes crucial for next-generation AI and ML hardware. My expertise is rooted in applying Statistical Design of Experiments (DOE) and advanced methodologies like Six Sigma directly to post-silicon issues. I leverage deep data analysis to quickly pinpoint and eliminate root causes of complex parametric and functional failures within System-on-Chip (SoC) architectures. Notably, I personally conceptualized and implemented the entire Yield Management System for ARM, a multi-billion dollar entity, delivering a mission-critical infrastructur...